Electrical Characterization Facility
Location: Room No. 201 ACMS
Current Status: Operational
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Key performance specifications a) Temperature range 10K - 350K b) Four micromanipulators with triaxial cables c) One optical arm for LASER excitation of samples (User provides LASER source) d) Maximum sample size 1inch x 1inch |
Current Status: Operational
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A platform for measurement of electrical characteristics with help of Semiconductor Parameter Analyzer from ambient to 300°C. a) Four micromanipulators with coaxial cables. b) Two micromanipulators with triaxial cables. c) Temperature range ambient temperature to 300°C d) Maximum sample size 12.7 mm x 12.7 mm e) Provision for chuck bias |
Current Status: Operational
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1. DC Current-Voltage measurement: 1.1 Current source/measure from 1 pA to 1 Amp 1.2 Voltage source/measure from 210 mV to 200 Volt 2. CV measurement: 2.1 Frequency = 1 kHz to 10 Mhz and 10 mHz to 10 Hz 3. Pulse IV: 3.1 Frequency range 1 Hz to 50 MHz; time resolution for measurement = 10 nano-sec |
Current Status: Operational
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Key performance specifications a) 1 GHz, 500 MHz, 350 MHz, and 100 MHz bandwidth models b) 2 and 4 analog channel models c) Up to 5 GS/s sample rate on all channels d) Up to 20 mega-point record length on all channels e) >50,000 wfm/s maximum waveform capture rate f) Standard passive voltage probes with less than 4 pF capacitive loading and 500 MHz or 1 GHz analog bandwidth g) Suite of advanced triggers |
Current Status: Operational
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1) Measurement capability: 1.1) Resistivity, type of conductivity, mobility and doping level in a material. 1.2) User has to provide the thickness of thin-film. 2) Magnetic-field strength : 2.1) Magnetic field strength ? 0.55 ± 0.03 Tesla (permanent magnet) 3) Sample Size: 3.1) SAMPLE HOLDER MODEL NO. - SH80350K 3.1.1) Temperature: 80 K - 350 K 3.1.2 Maximum sample thickness: Less than 2 mm 3.1.3 Maximum sample size: 10 mm x 10 mm 3.2) SAMPLE HOLDER MODEL NO. - SPCB-21 3.2.1) Only for room temperature measurement 3.2.2 Maximum sample thickness: Less than 2 mm 3.2.3 Maximum sample size: 15 mm x 15 mm |
Current Status:Operational
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# Measurement capability: a) The resistivity measurements of the sheet and bulk samples. b) Quick measurement of sheet resistance of thin-films, semiconductor wafer. |
CONTACT
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Instrument Name |
Faculty in charge |
Staff |
1. |
Low temperature Probe station |
Dr. Sarang Ingole sarang@iitk.ac.in |
Lab Staff Incharge: Mr. Pushpendra Kumar Lab Staff: |
2. |
Probe Station with Heating Stage |
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3. |
Semiconductor Parameter analyzer, along with an Oscilloscope |
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4. |
Table Top Hall Measurement System |
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5. |
Sheet resistance measurement system |
INSTRUMENTS |
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1. Cryogenic Probe Station |
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Current Status:Not Functional
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| Thermoelectric characterization system for bulk and thin film samples Temperature Capability: Thermoelectric characteristic evaluation of a wide range of materials from 50°C to 1000°C under helium gas ambient Type and dimensions of samples allowed: 1. Pellet with radially two ends polished flat as shown in the schematic below. 2. Rectangular bar For case (1.) and (2.) the surface of sample making contact with the electrodes would be in between 2x2 to 4x4 mm2. The distance between the two electrodes could be in the range of 5 to 22 mm only. 3. Cylindrical bar: - The diameter could be in the 2 - 4 mm range and the length should be in the range of 5 to 22 mm only. 4. Thin-film: - Use the special holder that has been provided for this purpose. |
Current Status:Operational
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MEASUREMENT VARIABLES: 1 For piezo sample holder unit: 1.1 Sample diameter: 3 mm to 25 mm 1.2 Sample thickness: 0.1 mm to 5 mm 1.3 Internal heater temperature range: 20 degree Celcius to 800 degree Celcius 1.4 Use of silicon oil possible to increase the flash-over voltage. 2 For thin film sample holder unit: 2.1 Maximum sample size allowed: 25 mm x 25 mm 2.2 Sample thickness: 0.1 mm to 10 mm 2.3 temperature range: 20 degree Celciusto 250 degree Celcius MEASUREMENT: * DHM - Dynamic Hysteresis Measurement * PM - Pulse Measurement * SHM - Static Hysteresis Measurement * LM - Leakage Current Measurement * FM - Fatigue Measurement * RM - Retention Measurement * IM - Imprint Measurement |
Current Status: Operational
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INSTRUMENT: Advanced Research Systems (ARS) closed cycle cryostat CS202AI-DMX-1SS with GMW 5403 Electromagnet Magnetic Field strength = 0.6 T Measurement: # Magneto resistance measurement/Hall effect measurement # Hall measurements from 10K to 800K. # Magnetic field strength = 0.6T note* Currently the arrangement for placing cryostat head between the poles of the magnet is not available. |
Current Status: Operational
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Key performance specifications # Metal deposition on the sample back side for better electrical contact during measurement. |
Current Status: Operational
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Multimodal NSOM provides simultaneous measurements of the topography and direct correlation between surface nano-features with resolution less than 50 nm and optical/electronic properties Mode of Operations |
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Special Features |
CONTACT
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Instrument Name |
Faculty in charge |
Staff |
1. |
Thermoelectric characterization system |
Dr. Tanmoy Maiti tmaiti@iitk.ac.in |
Lab Staff Incharge: Mr. Pushpendra Kumar Lab Staff: |
2. |
Piezo-electric, Pyro-electric, and Ferro-electric characterization facility |
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3. |
Close Cycle Cryostat with magnet |
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4. |
Table top sputter coater |
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5. |
Near Field Scanning Optical Microscope(NSOM) |
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Current Status: Operational
 Solartron 1260A |
Applications
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Features
# Wide frequency rangeSpanning 10 μHz to 32 MHz with 0.015ppm resolution, this analyzer provides excellent coverage for virtually all chemical and molecular mechanisms.
# Noise free analysis
- Frequency resolution: 1 in 65 million (0.015 ppm)
- 0.1%, 0.1° accuracy
- Resolution to 0.001 dB, 0.01°
- Measures impedances >100 MO
- 2-, 3- and 4- terminal measurement configurations
- Polarization voltage up to ±40.95 V
Current Status: Operational
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Measurement Capabilities
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Features
- High frequency range (42 Hz to 5 MHz)
- High resolution and high accuracy (± 0.08%)
- Fastest measurement time 5 ms
- Interactive touch panel operation
- Can be interfaced with the computer
Current Status: Operational
 Norecs make High
Temperature Probostat |
Features
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 GEN'AIR Oxygen Pump Gauge |
Features
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CONTACT
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Instrument Name |
Faculty in charge |
Staff |
1. |
Impedance Analyzer |
Dr. Shobit Omar
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Lab Staff Incharge: Lab Staff: |
2. |
LCR Meter |
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3. |
High-Temperature Probostat |
�INSTRUMENTS |
NON-IITK BOOKING PROCERSS |
1. Impedance Analyzer |
1. The online booking is valid only for IITK users. |