Equipments procured through FIST Grant: Eplexor 500N DMA
Large frequency range (0.01 - 200Hz); Ultra sensitive, force resolution - 0.00001N, strain resolution - 1nm, Tand resolution - 0.00001; Wide temperature range for testing (-150 - 600C)

Equipments procured through FIST Grant: FEI Nova NanoSEM
Field Emission Scanning Electron Microscope with EDS and EBSD attachments

Equipments procured through FIST Grant: Panalytical Empyrean XRD
High resolution four circle goniometer; Attachments for stress, texture, reflectivity and rocking curve analysis; High and low temperature measurements; Grazing angle capability for ultrathin films; Area detector, SAXS and transmission attachment; Different beam geometries to suit different samples